Characterization of Al2O3 films deposited by various methods
- 1 August 1986
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 142 (1) , 127-138
- https://doi.org/10.1016/0040-6090(86)90308-1
Abstract
No abstract availableThis publication has 16 references indexed in Scilit:
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