A test-pattern-generation algorithm for sequential circuits
- 1 June 1991
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Design & Test of Computers
- Vol. 8 (2) , 72-85
- https://doi.org/10.1109/54.82040
Abstract
A deterministic test-pattern-generation algorithm for synchronous sequential circuits is presented. The algorithm, called Essential, takes advantage of a procedure for learning global implications. It uses static and dynamic dominance relationships among signals, the concept of the potential propagation path, and intelligent heuristics to guide and accelerate the decision-making process for deterministic automatic test pattern generation (ATPG). Essential is based on the well-known method of reverse time processing, but it applies forward processing within time frames to avoid disadvantageous a priori determination of a path to be sensitized or of a primary output to which the fault effects must be propagated. It is designed to exploit fully the sophisticated techniques used for combinational circuits in the Socrates ATPG system. Experimental results for sequential ATPG obtained with Essential (implemented in C on a Sequent Symmetry computer) are reported.Keywords
This publication has 21 references indexed in Scilit:
- Sequential Circuit Test Generator (STG) benchmark resultsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Combinational profiles of sequential benchmark circuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- ESSENTIAL: an efficient self-learning test pattern generation algorithm for sequential circuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Test generation for highly sequential circuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Advanced automatic test pattern generation and redundancy identification techniquesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Sequential test generation at the register-transfer and logic levelsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- SOCRATES: a highly efficient automatic test pattern generation systemIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1988
- A topological search algorithm for ATPGPublished by Association for Computing Machinery (ACM) ,1987
- EBT: A Comprehensive Test Generation Technique for Highly Sequential CircuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1978
- Finding All the Elementary Circuits of a Directed GraphSIAM Journal on Computing, 1975