The investigation of excess carrier lifetimes in amorphous silicon by transient methods
- 1 July 1984
- journal article
- Published by Elsevier in Journal of Non-Crystalline Solids
- Vol. 66 (1-2) , 163-174
- https://doi.org/10.1016/0022-3093(84)90316-8
Abstract
No abstract availableThis publication has 29 references indexed in Scilit:
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