Composition depth information from the inelastic background signal in XPS
- 3 October 1985
- journal article
- Published by Elsevier in Surface Science
- Vol. 162 (1-3) , 875-885
- https://doi.org/10.1016/0039-6028(85)90992-6
Abstract
No abstract availableThis publication has 18 references indexed in Scilit:
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