1 μm range comparative length measurement using a regular crystalline lattice and a dual tunneling unit scanning tunneling microscope
- 1 May 1997
- journal article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
- Vol. 15 (3) , 574-578
- https://doi.org/10.1116/1.589294
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Correction of distorted STM image by using a regular crystalline lattice and 2D FFTNanotechnology, 1995
- Crystalline lattice for metrological applications and positioning control by a dual tunneling-unit scanning tunneling microscopeJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1991
- Tunneling through a controllable vacuum gapApplied Physics Letters, 1982