A 40 to 50 GHz HEMT test fixture
- 19 November 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Calibrating a Dual Six-Port or Four-Port for Measuring Two-Ports with Any ConnectorsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2005
- Broad-band determination of the FET small-signal equivalent circuitIEEE Transactions on Microwave Theory and Techniques, 1990
- Modeling of noise parameters of MESFETs and MODFETs and their frequency and temperature dependenceIEEE Transactions on Microwave Theory and Techniques, 1989