Photoelastic characterization of undoped semi-insulating GaAs wafers with a high-spatial-resolution infrared polariscope

Publisher Website

24 December 2002

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/sim.1996.570934

Abstract

No abstract available

Keywords

This publication has 2 references indexed in Scilit:

High-sensitivity computer-controlled infrared polariscope
Review of Scientific Instruments, 1993
Quantitative photoelastic measurement of residual strains in undoped semi-insulating gallium arsenide
Applied Physics Letters, 1985