Performance test case generation for microprocessors
- 27 November 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- No. 10930167,p. 54-59
- https://doi.org/10.1109/vtest.1998.670849
Abstract
We describe a systematic methodology for generating performance test cases for current generation microprocessors. Such rest cases are used for: (a) validating the expected pipeline flow behavior and timing; and, (b) detecting and diagnosing performance bugs in the design. We cite examples of application to a real, superscalar processor in pre- and post-silicon stages of development.Keywords
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