Spin cast thin films of fullerenes and fluorinated fullerenes: Preparation and characterization by x-ray reflectivity and surface diffuse x-ray scattering

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Abstract
We demonstrate that high quality thin films of fullerenes (C60) and fluorinated fullerenes can be prepared from solution by the spin coating technique on float glass or silicon wafers. The films were characterized by x‐ray reflectivity and diffuse x‐ray scattering. A systematic study of films of different thicknesses allows estimation of the distance between the fullerenes spheres to be 10.9±1 Å in our C60 films. The C60 film‐air surface is very smooth. Annealing in air above 90 °C leads to an irreversible increase of the film thickness, which is attributed, at present, to oxidation.