In situ ellipsometric studies of optical and surface properties of GaAs(100) at elevated temperatures
- 1 December 1991
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 206 (1-2) , 283-287
- https://doi.org/10.1016/0040-6090(91)90436-2
Abstract
No abstract availableThis publication has 13 references indexed in Scilit:
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