Secondary-ion mass spectrometry (SIMS) of organic compounds. I. Sample preparation methods
- 1 June 1983
- journal article
- Published by Elsevier in International Journal of Mass Spectrometry and Ion Physics
- Vol. 51 (1) , 47-61
- https://doi.org/10.1016/0020-7381(83)85028-1
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
- Secondary ion mass spectrometry of organic compoundsInternational Journal of Mass Spectrometry and Ion Physics, 1983
- Secondary Ion Mass Spectrometry of Organic Compounds; A Comparison with Other Methods (EI, CI, FI, FD, FAB)Published by Springer Nature ,1982
- High-resolution secondary ion mass spectrometry (SIMS) for use in chemistryInternational Journal of Mass Spectrometry and Ion Physics, 1981
- Experimental and theoretical approaches to the ionization process in secondary-ion emissionSurface Science, 1979
- The sputtering process and sputtered ion emissionSurface Science, 1979
- Secondary-ion emission of amino acidsApplied Physics B Laser and Optics, 1976
- Some problems encountered in secondary ion emission applied to elementary analysisSurface Science, 1975
- The use of secondary ion mass spectrometry in surface analysisSurface Science, 1975
- Analysis of Submonolayers on Silver by Negative Secondary Ion EmissionPhysica Status Solidi (b), 1969
- A new process of negative ion formationProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1936