Use of Ionic Implantation for Quantification of SIMS Analysis in Metals and Oxides — Application to Corrision Studies
- 1 January 1982
- book chapter
- Published by Springer Nature
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- The influence of yttrium implantation on the oxidation behaviour of 67Ni33Cr, Fe43Ni27Cr and Fe41Ni25Cr10Al refractory alloysCorrosion Science, 1980
- Variation of secondary ion emission yield with atomic concentrations of Fe, Ni, and Cr ternary alloys and oxides: Application to the analysis of thin oxide filmsJournal of Applied Physics, 1980