Probability models for pseudorandom test sequences
- 1 January 1988
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- Vol. 7 (1) , 68-74
- https://doi.org/10.1109/43.3131
Abstract
A probabilistic model for pseudorandom testing of combinational circuits is presented. The expected fault coverage is shown to be accurately approximated as a series of exponentials that depends on the test length and the fault detectabilities. The derivations do not require the pattern generator to have the same number of stages as there are network inputsKeywords
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