Using the C-V curve of an mis diode to examine the trapping levels in a semiconductor containing many discrete traps
- 30 April 1980
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 23 (4) , 391-397
- https://doi.org/10.1016/0038-1101(80)90207-5
Abstract
No abstract availableKeywords
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