Perturbation method for dielectric constant measurementof thick-film dielectric materials at microwave frequencies
- 15 October 1998
- journal article
- Published by Institution of Engineering and Technology (IET) in Electronics Letters
- Vol. 34 (21) , 2042-2044
- https://doi.org/10.1049/el:19981392
Abstract
A novel technique, using a cavity perturbation method, for measuring the relative permittivity of dielectric thick-film materials is presented. Measurement data have been obtained at X-band frequencies for two kinds of dielectric thick-film material. The method combines simplicity with high accuracy and has the potential to measure films as thin as 20 µm.Keywords
This publication has 1 reference indexed in Scilit:
- Relative permittivity measurement of thick-filmdielectrics at microwave frequenciesElectronics Letters, 1995