Relative permittivity measurement of thick-filmdielectrics at microwave frequencies
- 12 October 1995
- journal article
- Published by Institution of Engineering and Technology (IET) in Electronics Letters
- Vol. 31 (21) , 1812-1814
- https://doi.org/10.1049/el:19951243
Abstract
A novel extension of the resonant cavity technique used to measure relative permittivity at microwave frequencies is presented. The new technique is aimed particularly at the measurement of very thin dielectric layers and has been used to measure the permittivity of a thin dielectric layer printed onto a thick substrate whose permittivity is known. Successful experimental data has been obtained for 100 µm thick dielectrics at X-band.Keywords
This publication has 3 references indexed in Scilit:
- Dielectric material measurement of thin samples at millimeter wavelengthsIEEE Transactions on Instrumentation and Measurement, 1992
- Methods of measuring microwave relative complex permittivities of film, sheet and plate dielectric materialsElectrical Engineering in Japan, 1989
- Measurement techniques in microstripElectronics Letters, 1969