Methods of measuring microwave relative complex permittivities of film, sheet and plate dielectric materials
- 1 May 1989
- journal article
- research article
- Published by Wiley in Electrical Engineering in Japan
- Vol. 109 (3) , 28-37
- https://doi.org/10.1002/eej.4391090304
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Permittivity measurement of a thin slab centrally located in a rectangular waveguideJournal of Physics E: Scientific Instruments, 1975
- Null method for measuring small dielectric loss at microwave frequenciesProceedings of the Institution of Electrical Engineers, 1975
- Determination of dielectric parameters for films at microwave frequenciesJournal of Applied Physics, 1973
- Measurement of semiconductor properties in a slotted-waveguide structureProceedings of the Institution of Electrical Engineers, 1965