Permittivity measurement of a thin slab centrally located in a rectangular waveguide
- 1 November 1975
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 8 (11) , 963-966
- https://doi.org/10.1088/0022-3735/8/11/022
Abstract
The possibilities of permittivity measurement of sheet materials using a thin slab centrally located in a rectangular waveguide are discussed. The results obtained by several authors are commented on, and some new methods for the solution of the characteristic equation of the fundamental mode and for the measurement of the propagation constant of the dielectric loaded guide in the case of high and low loss materials are proposed. The conditions of single mode propagation are presented in the form of curves. Measurement results on perspex are given in X-band with an estimation of the possible errors.Keywords
This publication has 10 references indexed in Scilit:
- Measurement of the permittivity of films at microwave frequenciesJournal of Physics E: Scientific Instruments, 1974
- Determination of dielectric parameters for films at microwave frequenciesJournal of Applied Physics, 1973
- Dielectric Measurements of Sheet MaterialsIEEE Transactions on Instrumentation and Measurement, 1973
- Measurements on alumina and glasses using a TM020 mode resonant cavity at 9.34 GHzProceedings of the Institution of Electrical Engineers, 1972
- The accurate measurement of permittivity by means of an open resonatorProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1971
- A Simple Technique for the Accurate Determination of the Microwave Dielectric Constant for Microwave Integrated Circuit Substrates (Correspondence)IEEE Transactions on Microwave Theory and Techniques, 1971
- Calculation of the complex permittivity of lossy dielectric materials using the Roberts-von Hippel standing-wave methodElectronics Letters, 1969
- Modified Technique for Measuring Dielectric Constants Using a Rectangular Cavity ResonatorIEEE Transactions on Instrumentation and Measurement, 1967
- Measurement of semiconductor properties in a slotted-waveguide structureProceedings of the Institution of Electrical Engineers, 1965
- Microwave measurement of conductivity and dielectric constant of semiconductorsProceedings of the IEEE, 1963