Measurement of the permittivity of films at microwave frequencies
- 1 April 1974
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 7 (4) , 256-257
- https://doi.org/10.1088/0022-3735/7/4/012
Abstract
A method is proposed for the measurement of phase shift and attenuation using a slotted line. These measurements enable the complex permittivity of isotropic films to be found by mounting the specimen longitudinally at the centre of a rectangular waveguide, the electric field being in the plane of the film. Experiments have been performed on films of Mylar and Teflon for a range of thicknesses from 75 to 250 mu m. The experimental results agree well with the accepted values (within approximately 2%).Keywords
This publication has 3 references indexed in Scilit:
- Determination of dielectric parameters for films at microwave frequenciesJournal of Applied Physics, 1973
- Measurement of the Dielectric Constant and Loss Tangent of Isotropic Films at Millimeter WavelengthsReview of Scientific Instruments, 1965
- A study of energy-loss processes in germanium at high electric fields using microwave techniquesJournal of Physics and Chemistry of Solids, 1961