Investigation of interdiffusion in thin film couples of aluminum and copper by Auger electron spectroscopy
- 15 August 1979
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 61 (3) , 273-279
- https://doi.org/10.1016/0040-6090(79)90471-1
Abstract
No abstract availableKeywords
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