Backscatter Kikuchi diffraction in the SEM for identification of crystallographic point groups
- 1 January 1989
- Vol. 11 (6) , 305-312
- https://doi.org/10.1002/sca.4950110605
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Application of backscatter Kikuchi diffraction in the scanning electron microscope to the study of NiS2Journal of Applied Crystallography, 1989
- Determination of crystal symmetry from electron channelling patternsActa Crystallographica Section A Foundations of Crystallography, 1988
- On the breakdown of Friedel's law in electron backscattering channelling patternsActa Crystallographica Section A Foundations of Crystallography, 1988
- A scanning electron microscope stage for crystal orientation and structure determinationScripta Metallurgica, 1984