A scanning electron microscope stage for crystal orientation and structure determination
- 1 July 1984
- journal article
- Published by Elsevier in Scripta Metallurgica
- Vol. 18 (7) , 743-748
- https://doi.org/10.1016/0036-9748(84)90332-6
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Electron channeling patterns in the scanning electron microscopeJournal of Applied Physics, 1982
- Accurate microcrystallography using electron back-scattering patternsPhilosophical Magazine, 1977
- Electron back-scattering patterns—A new technique for obtaining crystallographic information in the scanning electron microscopePhilosophical Magazine, 1973