Interfacial Capacitance
- 1 January 1990
- journal article
- research article
- Published by Wiley in Physica Status Solidi (b)
- Vol. 157 (1) , 199-207
- https://doi.org/10.1002/pssb.2221570119
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- Interface contribution to the capacitance of thin-film Al-Al2O3-Al trilayer structuresApplied Physics Letters, 1987
- Dielectric Screening, Polar Phonons, and Longitudinal Electronic Excitations of Quantum Well Double Heterostructures Application to Light Scattering from Charge Density FluctuationsPhysica Status Solidi (b), 1985
- Electrostatic energy and screened charge interaction near the surface of metals with different Fermi surface shapeSurface Science, 1980
- The Linear Dielectric Response of a Semiconductor: A New Analytic Form for the Dielectric FunctionPhysica Status Solidi (b), 1974
- Dielectric and optical properties of ZnS filmsThin Solid Films, 1973
- Screening of external fields and distribution of excess charge near a metal surfacePhysics Letters A, 1972
- Theory of Metal Surfaces: Charge Density and Surface EnergyPhysical Review B, 1970
- Quantum Dielectric Theory of Electronegativity in Covalent Systems. I. Electronic Dielectric ConstantPhysical Review B, 1969
- Wave-Number-Dependent Dielectric Function of SemiconductorsPhysical Review B, 1962