Measurement of Lifetime of Carriers in Semiconductors through Microwave Reflection
- 1 April 1962
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 33 (4) , 1604
- https://doi.org/10.1063/1.1728779
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- Microwave Techniques in Measurement of Lifetime in GermaniumJournal of Applied Physics, 1959