Propagation constant determination in microwave fixture de-embedding procedure
- 1 April 1988
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Microwave Theory and Techniques
- Vol. 36 (4) , 706-714
- https://doi.org/10.1109/22.3575
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Accurate model for open end effect of microstrip linesElectronics Letters, 1981
- High-Speed Computation of Single and Coupled Microstrip Parameters Including Dispersion, High-Order Modes, Loss and Finite Strip ThicknessIEEE Transactions on Microwave Theory and Techniques, 1978
- A Generalization of the TSD Network-Analyzer Calibration Procedure, Covering n-Port Scattering-Parameter Measurements, Affected by Leakage ErrorsIEEE Transactions on Microwave Theory and Techniques, 1977
- Launcher and microstrip characterizationIEEE Transactions on Instrumentation and Measurement, 1976
- Losses in MicrostripIEEE Transactions on Microwave Theory and Techniques, 1968