The possibilities for analytical methods in photoemission and low-energy microscopy
- 31 May 1991
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 36 (1-3) , 52-62
- https://doi.org/10.1016/0304-3991(91)90137-u
Abstract
No abstract availableKeywords
This publication has 15 references indexed in Scilit:
- Atomic subshell photoionization cross sections and asymmetry parameters: 1 ⩽ Z ⩽ 103Published by Elsevier ,2004
- Scanning versus direct imaging emission microscopyUltramicroscopy, 1991
- Design of a spectroscopic low-energy electron microscopeUltramicroscopy, 1991
- The resolution of photoelectron microscopes with UV, X-ray, and synchrotron excitation sourcesUltramicroscopy, 1989
- Optimization of small electron probesUltramicroscopy, 1987
- The resolution of the low energy electron reflection microscopeUltramicroscopy, 1985
- Prospects in high resolution X-ray photoelectron microscopyUltramicroscopy, 1985
- The influence of radiation damage (microscopic causes) on the sensitivity of Auger electron spectroscopy and X-ray photoelectron spectroscopyApplications of Surface Science, 1985
- A nonrelativistic program for optical response in atoms using a time-dependent local density approximationComputer Physics Communications, 1984
- Low-energy x-ray interaction coefficients: Photoabsorption, scattering, and reflectionAtomic Data and Nuclear Data Tables, 1982