Initial atomic structure of CaF2/Si(111) interface formation
- 1 November 1989
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 72 (6) , 605-608
- https://doi.org/10.1016/0038-1098(89)91042-9
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
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- In-situ observation of defect formation in CaF2(111) surfaces induced by low energy electron bombardmentSurface Science, 1987
- Photoemission study of bonding at the-on-Si(111) interfacePhysical Review B, 1987
- Formation of a New Ordered Structure of Ca/Si(111) by Ultraviolet IrradiationPhysical Review Letters, 1986
- Determination of Interface States for Ca/Si(111) from Near-Edge X-Ray-Absorption MeasurementsPhysical Review Letters, 1986
- Structure and bonding at the CaF2/Si (111) interfaceApplied Physics Letters, 1986