Direct Observation of 18O Tracer Diffusion in a YBa2Cu3Oy Single Crystal by Secondary Ion Mass Spectrometry

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Abstract
Direct observation of 18O tracer diffusion by secondary ion mass spectrometry (SIMS) was made on a single crystal of YBa2Cu3O y with an array of steps on the stairlike surface. The unique distribution of the diffused 18O in the ab-plane and in the c-axis direction was shown visually as a mapped image, which revealed some fundamental processes on the oxygen penetration through the surface and diffusion in the inner crystal. It was found that at 530°C, the diffusion coefficient in an ab-plane is larger than that in a c-axis direction by more than five orders of magnitude.