A Lumped Coplanar to Microstrip Transition Model for De-Embedding S-Parameters Measured on GAAS Wafers

Publisher Website

1 June 1987

proceedings article
Published by Institute of Electrical and Electronics Engineers (IEEE)

p. 204-217
https://doi.org/10.1109/arftg.1987.323866

Abstract

No abstract available

This publication has 3 references indexed in Scilit:

Codex
IEEE Software, 1984
A Generalization of the TSD Network-Analyzer Calibration Procedure, Covering n-Port Scattering-Parameter Measurements, Affected by Leakage Errors
IEEE Transactions on Microwave Theory and Techniques, 1977
An Explicit Solution for the Scattering Parameters of a Linear Two-Port Measured with an Imperfect Test Set (Correspondence)
IEEE Transactions on Microwave Theory and Techniques, 1971