The a-SiOx:Hy thin film system I. Structural study by IR spectroscopy
- 1 August 1990
- journal article
- Published by Elsevier in Journal of Non-Crystalline Solids
- Vol. 122 (3) , 223-232
- https://doi.org/10.1016/0022-3093(90)90987-w
Abstract
No abstract availableKeywords
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