Improved MESFET characterization for analog circuit design and analysis

Abstract
The third derivative of MESFET drain current behavior is useful for devise characterization. It provides information necessary to device a model to predict large-signal dynamic behavior with accuracy over an extended range of operating conditions. Extra parameters are proposed to define behavior in subthreshold and triode operating regions. A continuously differentiable form that models third-order behavior correctly describes these regions. The result is an accurate large-signal model suitable for design and analysis of distortion and intermodulation in analog circuits.<>

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