Thickness Dependence of Conductivity due to the Polycrystalline Structure in Evaporated CdS Thin Films
- 1 January 1968
- journal article
- research article
- Published by Wiley in Physica Status Solidi (b)
- Vol. 28 (2) , K97-K100
- https://doi.org/10.1002/pssb.19680280246
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- ELECTRICAL CHARACTERISTICS OF EPITAXIAL GERMANIUM FILMS VACUUM DEPOSITED ON SEMI-INSULATING GaAs UP TO THICKNESSES OF 106 ÅApplied Physics Letters, 1966
- Über das Ausheilen von Gitterfehlern frisch aufgedampfter CdS‐Schichten (I)Physica Status Solidi (b), 1961