Electron diffraction and infrared study of the semimetallic layered compound Ti1−xVxSe2

Publisher Website

30 September 1980

journal article
Published by Elsevier in Solid State Communications

Vol. 35 (12) , 925-929
https://doi.org/10.1016/0038-1098(80)90990-4

Abstract

No abstract available

Keywords

This publication has 11 references indexed in Scilit:

Angle-resolved photoemission studies of the band structure of Ti ${Se}_{2}$ and Ti $S_{2}$
Physical Review B, 1980
Lattice dynamics of Ti ${Se}_{2}$
Physical Review B, 1979
Electrical resistivity and Hall effect in TiSe₂containing vanadium impurities
Journal of Physics C: Solid State Physics, 1979
Negative magnetoresistance and nonlinear conduction in Ti0.99V0.01Se2
Solid State Communications, 1979
Infra-red studies of TiSe₂: IR phonons and free carriers
Philosophical Magazine Part B, 1979
Transport properties and the phase transition in ${Ti}_{1 - x} M_{x} {Se}_{2} (M = Ta or V)$
Physical Review B, 1978
Band structure and lattice instability of Ti ${Se}_{2}$
Physical Review B, 1978
Ti ${Se}_{2}$ : Semiconductor, semimetal, or excitonic insulator
Physical Review B, 1978
Raman and infrared studies of superlattice formation in Ti ${Se}_{2}$
Physical Review B, 1977
Electronic properties and superlattice formation in the semimetal ${TiSe}_{2}$
Physical Review B, 1976