Surface Analysis: X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy
- 1 January 1996
- journal article
- Published by American Chemical Society (ACS) in Analytical Chemistry
- Vol. 68 (12) , 309-332
- https://doi.org/10.1021/a19600146
Abstract
No abstract availableThis publication has 319 references indexed in Scilit:
- Analytical techniques in high temperature corrosionOxidation of Metals, 1995
- X-Ray photoelectron spectroscopy characterization of amorphous and crystalline poly(tetrahydrofuran): experimental and theoretical studyPolymer, 1994
- Towards an element-specific magnetic domain imaging by core level photoemission with unpolarized lightZeitschrift für Physik B Condensed Matter, 1994
- Surface stoichiometry determination of SiOxNy thin films by means of XPSSurface and Interface Analysis, 1994
- An XPS valence band study of alkane chains secondary structureSurface and Interface Analysis, 1994
- Electron spectroscopy of porous silicon layers. Indirect detection of hydrogen by elastic peak electron spectroscopySurface and Interface Analysis, 1994
- True Auger spectral shapes: A step to standard spectraSurface and Interface Analysis, 1994
- Surface concentration modification of PtPd alloys by noble gas ion sputteringSurface and Interface Analysis, 1994
- Study of the bulk and surface acidity of protonated Y zeolites by TPD and XPSSurface and Interface Analysis, 1994
- A new experimental procedure for the backscattering correction in Auger analysisSurface and Interface Analysis, 1993