Precision Ion Polishing System -A New Instrument for TEM Specimen Preparation of Materials

Publisher Website

1 January 1991

journal article
Published by Springer Nature in MRS Proceedings

Vol. 254
https://doi.org/10.1557/proc-254-43

Abstract

No abstract available

Keywords

This publication has 2 references indexed in Scilit:

TEM specimen preparation of individual SiC/C composite (SCS-6) fibers
Proceedings, annual meeting, Electron Microscopy Society of America, 1991
Chemically Assisted Ion Beam Etching (CAIBE)- a New Technique for TEM Specimen Preparation of Materials
MRS Proceedings, 1990