Surface analysis using electron beam SNMS, applications and investigations of sputter yields
- 31 December 1989
- Vol. 39 (11-12) , 1089-1093
- https://doi.org/10.1016/0042-207x(89)91097-x
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
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- Quantitative Secondary Neutral Mass Spectrometry Analysis of Alloys and Oxide-Metal-InterfacesPublished by Springer Nature ,1983
- Matrix Effect Studies by Comparative SNMS and SIMS of OxidizedCe, Gd and Ta SurfacesPublished by Springer Nature ,1979
- Secondary ion yields near 1 for some chemical compoundsPhysics Letters A, 1972