Structural investigations of SiO-CeO2 thin films
- 1 May 1988
- journal article
- Published by Springer Nature in Journal of Materials Science
- Vol. 23 (5) , 1758-1763
- https://doi.org/10.1007/bf01115719
Abstract
No abstract availableKeywords
This publication has 31 references indexed in Scilit:
- An infrared spectroscopic study of vacuum-evaporated SiO-CeO2 thin filmsJournal of Materials Science, 1988
- Electrical conduction and observation of local defects in thin sandwich structures of Cu-SiO/CeO2-CuInternational Journal of Electronics, 1987
- A Study of Electron Spin Resonance in Thin Films of Silicon Monoxide with Cerium OxidePhysica Status Solidi (b), 1987
- Optical Absorption in Thin Films of Cerium Dioxide and Cerium Dioxide Containing Silicon MonoxidePhysica Status Solidi (b), 1986
- The refractive index of thin solid filmsPhysics Education, 1985
- Bonding Bands, Lone-Pair Bands, and Impurity States in Chalcogenide SemiconductorsPhysical Review Letters, 1972
- Optical properties of non-crystalline Si, SiO, SiOx and SiO2Journal of Physics and Chemistry of Solids, 1971
- Optical Properties and Electronic Structure of Amorphous GermaniumPhysica Status Solidi (b), 1966
- Berichtigungen zu meiner Arbeit: Über bisher unbekannte Eigenschaften einfacher Verbindungen und Betrachtungen über die Arten des festen ZustandesThe European Physical Journal A, 1925
- Über bisher unbekannte Eigenschaften einfacher Verbindungen und Betrachtungen über die Arten des festen ZustandesZeitschrift für Physik, 1925