A solution to the problem of stationary phase in double spectral modulation profilometry
- 15 July 1994
- journal article
- Published by Elsevier in Optics Communications
- Vol. 109 (5) , 375-379
- https://doi.org/10.1016/0030-4018(94)90484-7
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Surface profiling by means of double spectral modulationApplied Optics, 1993
- Refractive index distribution measurements by means of spectrally-resolved white-light interferometryOptics & Laser Technology, 1992
- Multichannel chromatic interferometry: metrology applicationsPublished by SPIE-Intl Soc Optical Eng ,1991
- Refractometry of liquid samples with spectrally resolved white light interferometryMeasurement Science and Technology, 1990