X-ray emission from slow highly charged Ar ions interacting with a Ge surface
- 1 August 1991
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review A
- Vol. 44 (3) , 1653-1658
- https://doi.org/10.1103/physreva.44.1653
Abstract
We have measured K x-ray spectra and yields from ions slowly approaching a single-crystal Ge surface. The yields were measured as a function of the projectile velocity component perpendicular to the surface. From the data a characteristic time of approximately 1 psec was extracted for the in-flight filling above the surface of the Ar K vacancy.
Keywords
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