Characterizing the turn-off performance of multi-cathode GTO thyristors using thermal imaging
- 1 July 1990
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Power Electronics
- Vol. 5 (3) , 357-362
- https://doi.org/10.1109/63.56527
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Design consideration for large current GTOPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- A time- and temperature-dependent 2-D simulation of the GTO thyristor turn-off processIEEE Transactions on Electron Devices, 1984
- A study on GTO turn-off failure mechanismPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1981
- Gate turn-off in p-n-p-n devicesIEEE Transactions on Electron Devices, 1966