Contribution of the gate insulator surface to work function measurements with a gas sensitive FET
- 25 June 2003
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- Vol. 1, 439-442
- https://doi.org/10.1109/icsens.2002.1037132
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
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