The design and calibration of a versatile PIXE/RBS facility
- 1 January 1988
- journal article
- Published by EDP Sciences in Revue de Physique Appliquée
- Vol. 23 (9) , 1557-1564
- https://doi.org/10.1051/rphysap:019880023090155700
Abstract
The design and performance of a PIXE (Proton Induced X-ray Emission) facility for trace element analysis is presented, with emphasis on those features which enhance the throughput and sensitivity. An on demand pulse pileup rejection system reduces the spectral distortion and increases the data collection rate. Special precautions are taken to minimize all sources of background and the calibration procedure is describedKeywords
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