Characterization of electro-optic properties of self-assembled monolayer by attenuated total reflection
- 31 January 2003
- journal article
- Published by Elsevier in Optical Materials
- Vol. 21 (1-3) , 413-416
- https://doi.org/10.1016/s0925-3467(02)00171-4
Abstract
No abstract availableKeywords
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