Tessellation Aspect of Combinational Cellular Array Testing
- 1 April 1974
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. C-23 (4) , 363-369
- https://doi.org/10.1109/t-c.1974.223951
Abstract
This paper introduces procedures which enable one to settle the tessellation problem for the class of combinational cellular arrays with each cell having a binary horizontal input and a binary vertical input. Where all input combinations are applicable to all cells in the array in this class, the necessary number of tests is obtained from necessary prime as well as composite tessellations.Keywords
This publication has 7 references indexed in Scilit:
- Microprogrammed ArraysIEEE Transactions on Computers, 1972
- Fault Detection and Location in Sequential Cellular ArraysPublished by Defense Technical Information Center (DTIC) ,1971
- Cellular Logic-in-Memory ArraysIEEE Transactions on Computers, 1969
- Testing for faults in combinational cellular logic arraysPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1967
- The undecidability of the domino problemMemoirs of the American Mathematical Society, 1966
- Cutpoint Cellular LogicIEEE Transactions on Electronic Computers, 1964
- ENTSCHEIDUNGSPROBLEM REDUCED TO THE AEA CASEProceedings of the National Academy of Sciences, 1962