Noise in MOS bucket-brigade devices
- 1 November 1975
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 22 (11) , 977-981
- https://doi.org/10.1109/T-ED.1975.18256
Abstract
Previous calculations of noise in bucket-brigade devices (BBD's) have ignored subthreshold leakage current even though BBD's operate in the subthreshold region over most of their useful frequency range. In this work, subthreshold leakage is included in the calculation, but surprisingly, it makes little difference in the end result. The noise spectrum in p-channel BBD's is measured and agrees well with the calculated noise spectrum which includes the effects of correlation between noise packets, imperfect charge transfer efficiency, and output circuitry.Keywords
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