Phase measurements using the Mirau correlation microscope
- 1 June 1991
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 30 (16) , 2197-2201
- https://doi.org/10.1364/ao.30.002197
Abstract
A new algorithm for extracting amplitude and phase information from the data collected by the Mirau correlation microscope is presented. The accuracy of the phase measurements is first determined by measuring phase steps and vertical resolutions in the nanometer range. Experimental results with metal gratings show good agreement with Fourier theory. An inverse filter is then used to improve the resolution of the system. The filtered image has sharper edges and better phase contrast.Keywords
This publication has 9 references indexed in Scilit:
- Differential interference contrast imaging on a real time confocal scanning optical microscopeApplied Optics, 1990
- Mirau correlation microscopeApplied Optics, 1990
- Correlation microscopeOptics Letters, 1990
- A novel thin film interferometerReview of Scientific Instruments, 1990
- Calibration requirements for Mirau and Linnik microscope interferometersApplied Optics, 1989
- Phase sensitive scanning optical microscopeApplied Physics Letters, 1984
- Digital Wavefront Measuring Interferometer for Testing Optical Surfaces and LensesApplied Optics, 1974