A 1060 nm diode laser system for dynamically probing silicon detectors
- 1 June 1996
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
- Vol. 374 (3) , 315-319
- https://doi.org/10.1016/0168-9002(96)00239-2
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Characterization and quality control of silicon microstrip detectors with an infrared diode laser systemNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1995
- The depletion properties of silicon microstrip detectors with variable strip pitchNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1994