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  3. Kinetics of Changes in N f and D it at the Si ‐ SiO2 Interface under Long‐Term Positive as well as Negative Bias‐Temperature Aging
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  5. 10.1149/1.2119641
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  3. Kinetics of Changes in N f and D it at the Si ‐ SiO2 Interface under Long‐Term Positive as well as Negative Bias‐Temperature Aging
  4. Cited-By
  5. 10.1149/1.2119641

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