Ellipsometric investigations of a substrate-thin film system with rough boundaries using the equivalent film theory

This publication has 9 references indexed in Scilit:

• The Effect of Electrostriction on the Anodic Oxidation of Tungsten
  Journal of the Electrochemical Society, 1978
• Effect of surface roughness on change of the polarization state of light reflected from silicon and germanium
  Applied Optics, 1976
• Der Einfluß der Rauhigkeit der Probenoberfläche auf die Ergebnisse ellipsometrischer Messungen bei GaAs
  Crystal Research and Technology, 1976
• Effect of the dipole interaction between island particles on the optical properties of an aggregated silver film
  Thin Solid Films, 1972
• Ellipsometric Parameters of Rough Surfaces and of a System Substrate-Thin Film with Rough Boundaries
  Optica Acta: International Journal of Optics, 1972
• Optical constants of rough surface by ellipsometry
  Journal of Physics D: Applied Physics, 1970
• Reflectance and Ellipsometry When Submicroscopic Particles Bestrew a Surface*
  Journal of the Optical Society of America, 1970
• Errors arising from surface roughness in ellipsometric measurement of the refractive index of a surface
  Surface Science, 1969
• XII. Colours in metal glasses and in metallic films
  Philosophical Transactions of the Royal Society A, 1904