The parameterless correction method in X-ray microanalysis
Open Access
- 1 January 1990
- journal article
- Published by EDP Sciences in Microscopy Microanalysis Microstructures
- Vol. 1 (1) , 1-22
- https://doi.org/10.1051/mmm:01990001010100
Abstract
Microscopy Microanalysis Microstructures, a publication of the Société Française des MicroscopiesKeywords
This publication has 4 references indexed in Scilit:
- X-ray microanalysis of second-phase precipitates in copper/zinc/aluminium shape-memory alloys based on the parameterless correction methodAnalytica Chimica Acta, 1987
- Biological X‐Ray MicroanalysisJournal of Microscopy, 1979
- Limitations in the X-ray microanalysis of thin foils in a scanning transmission electron microscopeJournal of Microscopy, 1977
- The quantitative analysis of thin specimensJournal of Microscopy, 1975